5th IEEE International Workshop on
Silicon Debug and Diagnosis - SDD08
 April 30th- May 1st, 2008
San Diego, California, USA
Held in conjunction with the IEEE VLSI Test Symposium 2008
SDD 2005 SDD 2006 SDD 2007 Submission Registration Final Program   Call for Papers  
General Chair:
F. Muradali - National Semi.
Program Chair:
B. Vermeulen - NXP Semi.
Finance Chair:
M. Ricchetti - AMD
Special Sessions:
T. McLaurin - ARM
Asian Liaison:
K. Hatayama - STARC
European Liaison:
D. Appello - STMicroelectronics
University Liaison:
N. Nicolici - McMaster Univ.
Local Arrangements:
I. Harris - UC Irvine
Electronic Media:
I. Bayraktaroglu - Sun

Program Committee:
M. Abramovici - DAFCA
C. Boit - TU Berlin
R. Guo - Mentor Graphics
B. Cory - nVidia
A. Crouch - Inovys
B. Eklow - Cisco
J. Giacobbe - Intel
S. Gupta - USC
I. Hartanto - Xilinx
Y-C. Hsu - Novas
D. Josephson - Intel
R. Kapur - Synopsys
H. Kerkhoff - Univ. Twente
C. Metra - Univ. Bologna
Y. Okuda - Sony
A. Orailoglu - UCSD
I. Parulkar - Sun Microsystems
P. Prinetto - Poli. Di Torino
M. Renovell - LIRMM
M.S. Reorda - Poli. Di Torino
N. Stollon - HDLdynamics
C. Sul - Silicon Image
J. Tyzer - U. Poznan
S. Venkataraman - Intel
B. West
Z. Zilic - McGill Univ.

Steering Committee:
R. Aitken - ARM
F. Muradali - National Semi.
E.J. Marinissen - NXP Semi.
M. Ricchetti - AMD (chair)
Y. Zorian - Virage Logic

Preliminary Call for Papers

Scope and Mission
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work can however become very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market, the traditional focus on only pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity.

SDD08 will be held in San Diego, California, USA. It is the fifth in a series of highly successful technical workshops. Its mission and objective is to consider all issues related to debug and diagnosis of systems and circuits - from prototype bring-up to volume production.

The topics of interest include, but are not limited to, the following:
Debug Techniques and MethodologiesMicroprocessor, FPGA, IP, SOC Debug
Design and Synthesis for DebugInfrastructure IP for SDD
DFT Reuse for Debug and DiagnosisSystem Level Debug & Diagnosis
Debug & Diagnosis ArchitecturesManufacturing & Prototype Environment
ToolsEquipment Impact and Techniques
Debug StandardizationCross-geography turn-on, debug & diagnosis issues
SDD vs. Yield & TTMDigital/Analog Turn-on
Case studies

Author Information
The workshop objective is to facilitate a valuable interactive information exchange. Contributions ranging from extended abstracts to full papers are acceptable for submission. Proposals that describe open issues, industry/technology needs or opinions are also welcome

  • Length Guideline: ranging from an one page, extended abstract up to 8 pages
  • Submissions due: March 7th
  • Acceptance Notification: March 21st
  • Final papers for inclusion into informal proceedings: April 1st

Proposals for discussion panels and other special sessions are also invited. Please submit a one page abstract for these to the web site or contact the Program Chair or Special Sessions Chair.
For general information contact:For submission & program information contact:
Fidel MuradaliBart Vermeulen
National SemiconductorNXP Semiconductors
Email: fidel.muradali@nsc.comEmail: bart.vermeulen@nxp.com

SDD08 is sponsored by the IEEE Computer Society Test Technology Technical Council. For more information on SDD08, visit the website at: http://www.sdd-online.org